On-Wafer Cryogenic Characterization Technique of an SIS-Based Frequency Up and Down Converter
Crossref DOI link: https://doi.org/10.1007/s10909-020-02414-5
Published Online: 2020-03-07
Published Print: 2020-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kojima, Takafumi http://orcid.org/0000-0001-7949-6528
Uzawa, Yoshinori
Shan, Wenlei
Kozuki, Yuto
Funding for this research was provided by:
Japan society for the promotion of science (JP19H02205, JP18H03881)
Text and Data Mining valid from 2020-03-07
Version of Record valid from 2020-03-07
Article History
Received: 4 August 2019
Accepted: 12 February 2020
First Online: 7 March 2020