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Correction: Fabrication and Characterization of Boron-Implanted Silicon Superconducting Thin Films on SOI Substrates for Low-Temperature Detectors

Crossref DOI link: https://doi.org/10.1007/s10909-024-03226-7

Published Online: 2024-11-02

Published Print: 2025-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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