An a Posteriori Error Estimate for Scanning Electron Microscope Simulation with Adaptive Mesh Refinement
Crossref DOI link: https://doi.org/10.1007/s10915-019-00995-2
Published Online: 2019-07-08
Published Print: 2019-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mitchell, William F. http://orcid.org/0000-0002-0731-5553
Villarrubia, John S. http://orcid.org/0000-0001-7791-6293
Text and Data Mining valid from 2019-07-08
Version of Record valid from 2019-07-08
Article History
Received: 30 March 2018
Revised: 8 May 2019
Accepted: 18 June 2019
First Online: 8 July 2019