Transient Eddy Current NDE System Based on Fluxgate Sensor for the Detection of Defects in Multilayered Conducting Material
Crossref DOI link: https://doi.org/10.1007/s10921-018-0511-3
Published Online: 2018-07-10
Published Print: 2018-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nagendran, R.
Mohanty, Ijee
Thanikai Arasu, A. V.
Baskaran, R.
Text and Data Mining valid from 2018-07-10
Article History
Received: 8 January 2018
Accepted: 29 June 2018
First Online: 10 July 2018