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Study of the Choice of Excitation Frequency for Sub Surface Defect Detection in Electrically Thick Conducting Specimen Using Eddy Current Testing

Crossref DOI link: https://doi.org/10.1007/s10921-018-0520-2

Published Online: 2018-09-04

Published Print: 2018-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Perumal, Mahesh Raja https://orcid.org/0000-0002-1807-1064
Balasubramaniam, Krishnan https://orcid.org/0000-0003-2221-0933
Arunachalam, Kavitha https://orcid.org/0000-0002-9532-5259
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Text and Data Mining valid from 2018-09-04
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Article History

Received: 21 September 2017

Accepted: 28 July 2018

First Online: 4 September 2018