Detecting Phase-Type Defects of Transparent Samples Using Infrared Phase-Shifting Shearing Interferometer
Crossref DOI link: https://doi.org/10.1007/s10921-019-0637-y
Published Online: 2019-09-24
Published Print: 2019-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lin, Shyh-Tsong
Trinh, Xuan-Hung
Hoang, Hong-Hai
Text and Data Mining valid from 2019-09-24
Version of Record valid from 2019-09-24
Article History
Received: 14 May 2018
Accepted: 17 September 2019
First Online: 24 September 2019