Crossmark

Multiple Wavemode Scanning for Near and Far-Side Defect Characterisation

Crossref DOI link: https://doi.org/10.1007/s10921-019-0651-0

Published Online: 2020-01-08

Published Print: 2020-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Xiang, L

Edwards, R S https://orcid.org/0000-0003-2550-3627
Funding

Funding for this research was provided by:

University of Warwick
License Information

Text and Data Mining valid from 2020-01-08

Version of Record valid from 2020-01-08
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Article History

Received: 25 September 2019

Accepted: 27 December 2019

First Online: 8 January 2020