A Novel Method for Thickness Measurement in Conducting Materials by Apparent Conductivity Calculation Through Transient Eddy Current NDE
Crossref DOI link: https://doi.org/10.1007/s10921-021-00762-0
Published Online: 2021-03-04
Published Print: 2021-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nagendran, R.
Bisht, Lata
Mohanty, Ijee
Text and Data Mining valid from 2021-03-01
Version of Record valid from 2021-03-01
Article History
Received: 4 November 2020
Accepted: 10 February 2021
First Online: 4 March 2021