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Compensating Streak Artifacts in Sparse-View Inline Industrial CT for Accurate Metrology using Self-Supervised Optimization of Implicit Neural Volume Representations

Crossref DOI link: https://doi.org/10.1007/s10921-025-01310-w

Published Online: 2025-12-28

Published Print: 2026-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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