Wavelet Signal Processing for Resolution Enhancement in a Recurrence Tracking Microscope
Crossref DOI link: https://doi.org/10.1007/s10946-017-9660-6
Published Online: 2017-11-03
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Akhtar, Naeem
Ullah, Hayat
al Omari, Aiman
Saif, Farhan
License valid from 2017-09-01