An Apertureless Scanning Near-Field Optical Microscope Probe with a Lateral Resolution of 10 – 15 nm Observed with a Semiconductor Structure
Crossref DOI link: https://doi.org/10.1007/s10946-023-10174-2
Published Online: 2023-11-24
Published Print: 2023-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kazantsev, D. V.
Klekovkin, A. V.
Minaev, I. I.
Kazantseva, E. A.
Nikolaev, S. N.
Text and Data Mining valid from 2023-11-01
Version of Record valid from 2023-11-01
Article History
Received: 28 September 2023
First Online: 24 November 2023