The Influence of the Microstructure and Morphology of CeO 2 Buffer Layer on the Properties of YBCO Films PLD Grown on Ni Tape
Crossref DOI link: https://doi.org/10.1007/s10948-014-2679-9
Published Online: 2014-08-31
Published Print: 2014-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mihalache, V.
Stefan, N.
Enculescu, I.
Mihailescu, I. N.
Socol, M.
Miroi, M.
Text and Data Mining valid from 2014-08-31