SEM, XPS Studies, and Magnetoresistance Properties of Co, Ni, Co–N, and Ni–N Thin Films Prepared by Electrodeposition
Crossref DOI link: https://doi.org/10.1007/s10948-015-3269-1
Published Online: 2015-11-16
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tanase, S. I.
Tanase, D.
Dobromir, M.
Sandu, A. V.
Georgescu, V.
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