Document is current

Any future updates will be listed below

A Novel Method to Measure Microwave Critical Current Densities at Different Frequencies in HTS Thin Films

Crossref DOI link: https://doi.org/10.1007/s10948-016-3683-z

Published Online: 2016-08-16

Published Print: 2016-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark