Grain-Size-Dependent Low-Temperature Electrical Resistivity of Polycrystalline Co2MnAl Heusler Alloy Thin Films
Crossref DOI link: https://doi.org/10.1007/s10948-016-3957-5
Published Online: 2016-12-28
Published Print: 2017-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yilgin, Resul https://orcid.org/0000-0002-9580-2203
Oogane, Mikihiko
Ando, Yasuo
Miyazaki, Terunobu
License valid from 2016-12-28
