Polarized XAFS Analyses for MgB2 Thin Films
Crossref DOI link: https://doi.org/10.1007/s10948-017-3991-y
Published Online: 2017-02-08
Published Print: 2017-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Miyanaga, T.
Matsumura, R.
Seo, M.
Takeda, K.
Hatanaka, D.
Yoshizawa, M.
License valid from 2017-02-08