Stability Considerations Using a Microscopic Stability Model Applied to a 2G Thin Film Coated Superconductor
Crossref DOI link: https://doi.org/10.1007/s10948-017-4245-8
Published Online: 2017-08-08
Published Print: 2018-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Reiss, Harald http://orcid.org/0000-0002-2952-6124
License valid from 2017-08-08