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A Critical Review of Current Studies on Hydrogen Defect in Diluted Magnetic Semiconductors and Relative Ferroelectric Materials for Smart Electronic Applications

Crossref DOI link: https://doi.org/10.1007/s10948-022-06399-y

Published Online: 2022-09-30

Published Print: 2022-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Thoan, Nguyen Hoang

Khoa, Bui Viet

Dung, Dang Duc https://orcid.org/0000-0002-1979-6796
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Text and Data Mining valid from 2022-09-30

Version of Record valid from 2022-09-30
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Article History

Received: 21 August 2022

Accepted: 5 September 2022

First Online: 30 September 2022

Declarations

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: The authors declare no competing interests.

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