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Study of the Switching Field Distribution and the S* Loop Squareness for Evaporated Fe Thin Films: Effect of Substrates and Thickness

Crossref DOI link: https://doi.org/10.1007/s10948-024-06725-6

Published Online: 2024-03-18

Published Print: 2024-07

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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