Comparative Analysis of the Matrix Method and the Finite-Difference Method for Modeling the Distribution of Minority Charge Carriers in a Multilayer Planar Semiconductor Structure
Crossref DOI link: https://doi.org/10.1007/s10958-022-06168-1
Published Online: 2022-11-12
Published Print: 2022-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Seregina, E. V.
Kalmanovich, V. V.
Stepovich, M. A.
Text and Data Mining valid from 2022-11-01
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Article History
First Online: 12 November 2022