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Application of deep metric learning model to microscope image analysis for the determination of UOC samples in nuclear forensics analysis

Published Online: 2024-01-04

Published Print: 2024-07

Authors

Kimura, Yoshiki https://orcid.org/0009-0001-3347-6043
Matsumoto, Tetsuya

Yamaguchi, Tomoki
Funding

Funding for this research was provided by:

Ministry of Education, Culture, Sports, Science and Technology
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Text and Data Mining valid from 2024-01-04

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Article History

Received: 20 September 2023

Accepted: 25 November 2023

First Online: 4 January 2024

Declarations

:

: This study was supported by the "promotion of strengthening nuclear security or the like" from the Japanese government, MEXT (Ministry of Education, culture, sports, science, and Technology) received by the Japan Atomic Energy Agency (JAEA), which the authors belong to.

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