Document is current

Any future updates will be listed below

Low energy Xe ion beam engineering in optical, structural and morphological properties of hafnium oxide thin films grown by atomic layer deposition technique

Crossref DOI link: https://doi.org/10.1007/s10967-024-09747-5

Published Online: 2024-09-13

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark