Crossmark

A coincidence ion beam analysis methodology for high resolution depth profiling of nickel using a resonance in the 58Ni(p, γ)59Cu reaction

Published Online: 2025-08-02

Authors

Sukumar, A. A.

Lakshmipathy, D. V.

Sunitha, Y.

Jayabun, Sk

Ramana, J. V.

Reddy, G. L. N. https://orcid.org/0000-0001-7593-6485
Funding

Funding for this research was provided by:

Bhabha Atomic Research Centre
License Information

Text and Data Mining valid from 2025-08-02

Version of Record valid from 2025-08-02
More Information

Article History

Received: 19 April 2025

Accepted: 23 July 2025

First Online: 2 August 2025

Document is current