Correlation between alkaline-earth-metal dopants and threshold voltage (Vth) stability of solution-processed gallium indium oxide thin film transistors
Crossref DOI link: https://doi.org/10.1007/s10971-014-3560-9
Published Online: 2014-11-11
Published Print: 2015-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Park, Jee Ho
Yoo, Young Bum
Oh, Jin Young
Lee, Tae Il
Lee, Se Jong
Baik, Hong Koo
Text and Data Mining valid from 2014-11-11