Influence of nickel incorporation on structural, optical and electrical characteristics of SILAR synthesized CuO thin films
Crossref DOI link: https://doi.org/10.1007/s10971-018-4711-1
Published Online: 2018-06-12
Published Print: 2018-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Das, Mahima Ranjan
Mitra, Partha
Text and Data Mining valid from 2018-06-12
Article History
Received: 24 November 2017
Accepted: 23 May 2018
First Online: 12 June 2018
Compliance with ethical standards
:
: The authors declare that they have no conflict of interest.