Investigation of morphological and electrical properties of RTA-processed TiO2 for memristor application
Crossref DOI link: https://doi.org/10.1007/s10971-020-05395-9
Published Online: 2020-09-03
Published Print: 2020-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Roy, S.
Ghosh, S. P.
Pradhan, D.
Sahu, P. K.
Kar, J. P.
Text and Data Mining valid from 2020-09-03
Version of Record valid from 2020-09-03
Article History
Received: 20 May 2020
Accepted: 18 August 2020
First Online: 3 September 2020
Compliance with ethical standards
:
: The authors declare that they have no conflict of interest.