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Influence of the annealing temperature on the microstructure and energy storage performance in lead-free Ba(Zr0.3Ti0.7)O3 ferroelectric relaxor thin film

Crossref DOI link: https://doi.org/10.1007/s10971-025-06968-2

Published Online: 2025-10-24

Published Print: 2025-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Chen, Wenwen

Ren, Feiyu

Ye, Xinle

Qiu, Guoxiu

Liu, Yunfei

Lyu, Yinong

Luo, Jin
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Text and Data Mining valid from 2025-10-24

Version of Record valid from 2025-10-24
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Article History

Received: 22 November 2024

Accepted: 25 September 2025

First Online: 24 October 2025

Compliance with ethical standards

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: The authors declare no competing interests.

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