Channel temperature measurement in hermetic packaged GaN HEMTs power switch using fast static and transient thermal methods
Crossref DOI link: https://doi.org/10.1007/s10973-017-6275-7
Published Online: 2017-03-15
Published Print: 2017-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chen, Szu-Hao
Chou, Po-Chien
Cheng, Stone http://orcid.org/0000-0003-3388-4802
Funding for this research was provided by:
Ministry of Science and Technology, Taiwan (104-2221-E-009-123)
License valid from 2017-03-15