Technique for Contactless Measurements of the Electromagnetic Parameters of Thin Films and Nanomaterials
Crossref DOI link: https://doi.org/10.1007/s11018-016-1027-9
Published Online: 2016-10-08
Published Print: 2016-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Skvortsov, B. V.
Borminskii, S. A.
Solntseva, A. V.
License valid from 2016-09-01
