Estimate of Errors in the Determination of Parameters of Linear Thermal Circuits of Semiconductor Devices Based on the Frequency Dependence of the Thermal Impedance
Crossref DOI link: https://doi.org/10.1007/s11018-016-1056-4
Published Online: 2016-11-15
Published Print: 2016-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sergeev, V. A.
Frolov, I. V.
License valid from 2016-11-01
