Measurements of the Electrical Characteristics of Bipolar and MOS Transistors Under the Effect of Radiation
Crossref DOI link: https://doi.org/10.1007/s11018-017-1100-z
Published Online: 2017-02-18
Published Print: 2017-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Petrosyants, K. O.
Samburskii, L. M.
Kharitonov, I. A.
Kozhukhov, M. V.
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