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Calibration of Scanning Electron Microscopes over a Wide Range of Magnifications

Crossref DOI link: https://doi.org/10.1007/s11018-017-1123-5

Published Online: 2017-05-01

Published Print: 2017-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Kirtaev, R. V.

Kuzin, A. Yu.

Maslov, V. G.

Mityukhlyaev, V. B.

Todua, P. A.

Filippov, M. N.
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License valid from 2017-03-01