Using Variations in the Frequency of a Ring Oscillator to Measure the Thermal Resistance of Digital Integrated Circuits
Crossref DOI link: https://doi.org/10.1007/s11018-018-1402-9
Published Online: 2018-06-25
Published Print: 2018-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sergeev, V. A.
Teten’kin, Ya. G.
Text and Data Mining valid from 2018-05-01
Article History
Received: 13 November 2017
First Online: 25 June 2018