Analysis and Synthesis of Methods for Measuring the S-Parameters of Microwave Transistors
Crossref DOI link: https://doi.org/10.1007/s11018-019-01573-6
Published Online: 2019-03-29
Published Print: 2019-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Savel’kaev, S. V.
Litovchenko, V. A.
Text and Data Mining valid from 2019-03-01
Article History
Received: 28 August 2018
First Online: 29 March 2019