Measurement of the Energy Resolution of Silicon X-Ray Detectors Using Absorption Edge Spectra
Crossref DOI link: https://doi.org/10.1007/s11018-019-01646-6
Published Online: 2019-11-01
Published Print: 2019-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Osadchii, S. M.
Petukhov, A. A.
Dunin, V. B.
Text and Data Mining valid from 2019-08-01
Version of Record valid from 2019-08-01
Article History
Received: 6 February 2019
First Online: 1 November 2019