Measurement of the Spatial Characteristics of Erosion Laser Plasma of Silicon Using Compact High-Resolution Spectrometers
Crossref DOI link: https://doi.org/10.1007/s11018-021-01893-6
Published Online: 2021-05-28
Published Print: 2021-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lapshinov, B. A.
Timchenko, N. I.
Text and Data Mining valid from 2021-04-01
Version of Record valid from 2021-04-01
Article History
Received: 25 June 2020
Accepted: 2 July 2020
First Online: 28 May 2021