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A study of the dielectric and ferroelectric properties of SBN60 relaxor ferroelectric thin films on semiconductor substrates in a wide temperature range

Crossref DOI link: https://doi.org/10.1007/s11018-025-02460-z

Published Online: 2025-12-01

Published Print: 2025-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Makinyan, Norayr V. https://orcid.org/0009-0007-6748-3026
Pavlenko, Anatoly V. https://orcid.org/0000-0002-4257-2950
Popov, Petr V. https://orcid.org/0000-0001-8435-4356
Bobylev, Vyacheslav A. https://orcid.org/0000-0002-2214-0616
Matyash, Yana Yu. https://orcid.org/0000-0003-1725-5635
Stryukov, Daniil V. https://orcid.org/0000-0001-5597-3801
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Text and Data Mining valid from 2025-11-01

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Article History

Received: 20 December 2024

Accepted: 22 May 2025

First Online: 1 December 2025

Conflict of interest

: The authors declare no potential conflict of interest with respect to the research.

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