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Possibilities of Scanning and Transmission Electron Microscopy for Comparative Analysis of the Microstructure of In-Situ Nanocomposite High-Strength Conductors Based on a Copper Matrix and BCC-Metals

Crossref DOI link: https://doi.org/10.1007/s11041-016-9990-y

Published Online: 2016-07-28

Published Print: 2016-07

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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