Development of pathological brain detection system using Jaya optimized improved extreme learning machine and orthogonal ripplet-II transform
Crossref DOI link: https://doi.org/10.1007/s11042-017-5281-x
Published Online: 2017-11-27
Published Print: 2018-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nayak, Deepak Ranjan
Dash, Ratnakar
Majhi, Banshidhar
License valid from 2017-11-27