Detection of oxidation region of flexible integrated circuit substrate based on topology mapping
Crossref DOI link: https://doi.org/10.1007/s11042-018-6466-7
Published Online: 2018-08-16
Published Print: 2019-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhong, Zhiyan
Hu, Yueming
Text and Data Mining valid from 2018-08-16
Article History
Received: 30 September 2017
Revised: 24 March 2018
Accepted: 25 July 2018
First Online: 16 August 2018