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Authors
Liu, Ruixin
Wang, Dengzhun
Chen, Zhonghui
Li, Zhilin
Xiao, Hui
Yan, Chunyu
Yan, Jianwei
Lu, Ping
Xie, Benliang
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Funding
Funding for this research was provided by:
Guizhou Provincial Science and Technology Projects (No.ZK[2023]060)
National Natural Science Foundation of China (61562009)
National Key Research and Development Program (2016YFD0201305-07)
Open Fund Project in Semiconductor Power Device Reliability Engineering Center of Ministry of Education (ERCMEKFJJ2019-06)
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Article History
Received: 25 August 2022
Revised: 21 June 2023
Accepted: 25 December 2024
First Online: 10 January 2025
Declarations
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: The authors declare no conflict of interest involved in this paper.
