Evolution of the localized surface plasmon resonance and electron confinement effect with the film thickness in ultrathin Au films
Crossref DOI link: https://doi.org/10.1007/s11051-015-2880-1
Published Online: 2015-02-04
Published Print: 2015-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, X. D.
Chen, T. P.
Liu, Y.
Leong, K. C.
Text and Data Mining valid from 2015-02-01
