Reliability analysis and comparison of demodulation methods for Raman distributed temperature sensor
Crossref DOI link: https://doi.org/10.1007/s11082-014-0008-y
Published Online: 2014-09-11
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Luo, S.
Chang, J.
Zhang, S. S.
Wang, Z. L.
Jiang, S.
Sun, B. N.
Jia, C. W.
Wang, F. P.
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