Measurement of minority carrier lifetime in infrared photovoltaic detectors using parallel circuit method
Crossref DOI link: https://doi.org/10.1007/s11082-014-0073-2
Published Online: 2014-11-18
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cui, Haoyang
Wang, Chaoqun
Wang, Jialin
Liu, Can
Pi, Kaiyun
Li, Xiang
Tang, Zhong
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