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Application of Mie theory and fractal models to determine the optical and surface roughness of Ag–Cu thin films

Crossref DOI link: https://doi.org/10.1007/s11082-017-1079-3

Published Online: 2017-07-03

Published Print: 2017-07

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Țălu, Ștefan

Yadav, Ram Pratap

Mittal, Ashok Kumar

Achour, Amine

Luna, Carlos

Mardani, Mohsen

Solaymani, Shahram

Arman, Ali https://orcid.org/0000-0003-1246-0453
Hafezi, Fatemeh

Ahmadpourian, Azin

Naderi, Sirvan

Saghi, Khalil

Méndez, Alia

Trejo, Gabriel
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