Optical characterization of nanostructured Ge1 − xSnxSe2.5 (x = 0, 0.3, 0.5) films
Crossref DOI link: https://doi.org/10.1007/s11082-018-1717-4
Published Online: 2018-12-10
Published Print: 2019-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Deepika, http://orcid.org/0000-0002-5313-0023
Singh, H.
Saxena, N. S.
Funding for this research was provided by:
Department of Science and Technology, New Delhi, India (SR/WOS-A/PM-1017/2014)
Text and Data Mining valid from 2018-12-10
Article History
Received: 8 June 2018
Accepted: 26 November 2018
First Online: 10 December 2018