The Most Reliable and Precise Model to Determine Schottky Barrier Height and Photoelectron Yield Spectroscopy
Crossref DOI link: https://doi.org/10.1007/s11082-019-2088-1
Published Online: 2019-11-01
Published Print: 2019-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Changshi, Liu http://orcid.org/0000-0002-7496-385X
Text and Data Mining valid from 2019-11-01
Version of Record valid from 2019-11-01
Article History
Received: 17 June 2019
Accepted: 22 October 2019
First Online: 1 November 2019