Improved accuracy and defect detection in contour line determination of multiple-beam Fizeau fringes using Fourier fringe analysis technique
Crossref DOI link: https://doi.org/10.1007/s11082-020-02272-1
Published Online: 2020-02-24
Published Print: 2020-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
El-Morsy, M. A.
Funding for this research was provided by:
Prince Sattam bin Abdulaziz University (9708/01/2019)
Text and Data Mining valid from 2020-02-24
Version of Record valid from 2020-02-24
Article History
Received: 26 November 2019
Accepted: 15 February 2020
First Online: 24 February 2020