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Effect of annealing temperature on structural and optical properties of gallium oxide thin films deposited by RF-sputtering

Published Online: 2020-03-18

Published Print: 2020-04

Authors

Hassanien, A. M.

Atta, A. A.

El-Nahass, M. M.

Ahmed, Sameh I.

Shaltout, Abdallah A.

Al-Baradi, Ateyyah M.

Alodhayb, A.

Kamal, A. M.
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Text and Data Mining valid from 2020-03-18

Version of Record valid from 2020-03-18
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Article History

Received: 18 August 2019

Accepted: 10 March 2020

First Online: 18 March 2020

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