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Modeling electric field increment in the Tip-Enhanced Raman Spectroscopy by using grating on the probe of atomic force nanoscope

Crossref DOI link: https://doi.org/10.1007/s11082-021-03051-2

Published Online: 2021-07-10

Published Print: 2021-07

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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